Static information storage and retrieval – Read/write circuit – Precharge
Reexamination Certificate
2008-07-03
2010-06-08
Phung, Anh (Department: 2824)
Static information storage and retrieval
Read/write circuit
Precharge
C365S149000
Reexamination Certificate
active
07733725
ABSTRACT:
Driving a 1-transistor DRAM composed of an NMOS on top of a SOI layer such that the 1-transistor DRAM has a corresponding parasitic bipolar transistor component includes precharging, shifting, and deactivating steps. Implementing these steps can result in enhancing the performance of reading, writing and storing binary logic information within the 1-transistor DRAM memory device.
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Hong Suk Kyoung
Kang Hee Bok
Hynix / Semiconductor Inc.
Ladas & Parry LLP
Phung Anh
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