Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2005-11-16
2009-02-10
Le, Dieu-Minh (Department: 2114)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
C714S005110
Reexamination Certificate
active
07490262
ABSTRACT:
A method of determining whether a defect exists on an information storage medium is provided along with a recording/reproducing apparatus using the same. Such a method comprises: seeking a defect entry whose state information indicates that a defect block or a replacement block has been re-initialized without certification from a defect list for managing an information storage medium and including state information of the defect block and state information of the replacement block, wherein the medium includes a spare area for recording the replacement block to replace the defect block occurring in a user data area on the medium; and certifying the defect block or the replacement block registered in the sought defect entry. As a result, defect information can be effectively rearranged for quick re-initialization without certification in order to improve the performance of a drive system.
REFERENCES:
patent: 6160778 (2000-12-01), Ito et al.
patent: 6189113 (2001-02-01), Rabb et al.
patent: 6233699 (2001-05-01), Sasaki et al.
patent: 6526522 (2003-02-01), Park et al.
patent: 6785839 (2004-08-01), Ko et al.
patent: 6963523 (2005-11-01), Park
patent: 2002/0145966 (2002-10-01), Hirotsune et al.
patent: 2000-195178 (2000-07-01), None
patent: 2000-322836 (2000-08-01), None
patent: 2002-163864 (2002-06-01), None
patent: 2003-006876 (2003-01-01), None
patent: WO 2004/059648 (2004-07-01), None
International Search Report issued in International Application No. PCT/KR 2005/3890 on Feb. 14, 2006.
Hwang Sung-hee
Ko Jung-wan
Sung Hyo-jin
Le Dieu-Minh
Samsung Electronics Co,. Ltd.
Stein, McEwen & Bui LLP
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