Method of depositing titanium-containing conductive thin film

Coating processes – Direct application of electrical – magnetic – wave – or... – Plasma

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427571, 427574, 427576, 4272551, 118723E, H05H 173, H05H 146, C23C 1606, C23C 1650

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057210217

ABSTRACT:
A method of depositing a titanium-containing conductive thin film, which is capable of depositing a high-quality thin film having a low chlorine content by grounding, through a capacitor, a terminal of a plasma generating electrode disposed in a processing chamber. In the method, one of the introduction terminals of the plasma generating electrode is connected to a radio-frequency power source, the other terminal being grounded through the capacitor. Titanium tetrachloride, hydrogen gas, and nitrogen gas are introduced into the processing chamber at flowrates of 20 ml/min, 30 ml/min and 10 ml/min, respectively. The pressure in the processing chamber is set to about 1 Pa, and the temperature of the substrate is set to 450.degree. to 600.degree. C. A low-pressure, high-density plasma is generated with an output of the radio-frequency power source of 2.5 kW to deposit a titanium nitride film at a rate of about 30 nm/min. The resultant titanium nitride film has a chlorine content of 1% or less, metallic lustre and low resistance.

REFERENCES:
patent: 4557943 (1985-12-01), Rosler et al.
patent: 4675206 (1987-06-01), Ikegaya et al.
patent: 5271963 (1993-12-01), Eichman et al.
patent: 5395642 (1995-03-01), Hamerich et al.
patent: 5462775 (1995-10-01), Yamada et al.
patent: 5508066 (1996-04-01), Akahori
patent: 5567483 (1996-10-01), Foster et al.
Jpn. J. Appl. Phys. vol 34 (1995) pp. L516-L519; Part 2, No. 4B , 15 Apr. 1995.
8th Symposium on Plasma Science for Materials; P. 87, Jun. 1995.
Jpn. J. Appl. Phys. vol. 33 (1994) pp. 2189-2193; Part 1, No. 4B, Apr. 1994.
Jpn. J. Appl. Phys. vol 29, No. 6, Jun. 1990; pp. L1015-L018.

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