Method of de-chucking wafer using direct voltage and...

Electricity: electrical systems and devices – Electric charge generating or conducting means – Use of forces of electric charge or field

Reexamination Certificate

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Details

C361S230000

Reexamination Certificate

active

07869185

ABSTRACT:
Example embodiments provide a method of de-chucking a wafer by alternating between using a direct voltage and an alternating voltage, and an apparatus for fabricating a semiconductor device using the same. The method of de-chucking a wafer comprises interrupting a chucking voltage applied to an electrostatic chuck, applying a first de-chucking voltage to the electrostatic chuck, and applying a second de-chucking voltage to the electrostatic chuck.

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patent: 6500686 (2002-12-01), Katata et al.
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patent: 100282421 (2000-11-01), None
patent: 1020040105356 (2004-12-01), None
patent: 102005002901 (2005-03-01), None

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