Method of CVD for forming silicon nitride film on substrate

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate

Reexamination Certificate

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Reexamination Certificate

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07094708

ABSTRACT:
A CVD method is to form a silicon nitride film on a target substrate (W). The method includes heating the substrate (W) accommodated in a process container (8), at a process temperature, and supplying a process gas including hexaethylamino-disilane gas and ammonia gas onto the substrate (W) heated at the process temperature, thereby depositing a silicon nitride film on the substrate (W).

REFERENCES:
patent: 6475902 (2002-11-01), Hausmann et al.
patent: 2005/0095770 (2005-05-01), Kumagai et al.
patent: 7-273106 (1995-10-01), None
patent: 11-172439 (1999-06-01), None
patent: 03 046253 (2003-06-01), None

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