Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Reexamination Certificate
2006-08-22
2006-08-22
Whitehead, Jr., Carl (Department: 2813)
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Insulative material deposited upon semiconductive substrate
Reexamination Certificate
active
07094708
ABSTRACT:
A CVD method is to form a silicon nitride film on a target substrate (W). The method includes heating the substrate (W) accommodated in a process container (8), at a process temperature, and supplying a process gas including hexaethylamino-disilane gas and ammonia gas onto the substrate (W) heated at the process temperature, thereby depositing a silicon nitride film on the substrate (W).
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Kato Hitoshi
Kikuchi Hiroyuki
Maku Shingo
Orito Koichi
Harrison Monica D.
Jr. Carl Whitehead
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Tokyo Electron Limited
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