Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Patent
1998-07-01
2000-11-28
Everhart, Caridad
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
438242, 438243, 438244, 438245, 438268, 438259, H01L 21336
Patent
active
061534749
ABSTRACT:
The present invention includes a method and system to increase the deep trench sidewall surface area in a storage node on a DRAM chip. By tilting the trenches the capacitance is increased without taking up more space on the semiconductor chip.
REFERENCES:
patent: 4016062 (1977-04-01), Mehta et al.
patent: 4128765 (1978-12-01), Franks
patent: 4214966 (1980-07-01), Mahoney
patent: 4309267 (1982-01-01), Boyd et al.
patent: 4502913 (1985-03-01), Lechaton et al.
patent: 5096849 (1992-03-01), Beilstein et al.
patent: 5205902 (1993-04-01), Horton et al.
patent: 5225697 (1993-07-01), Malhi et al.
patent: 5350499 (1994-09-01), Shibaike et al.
patent: 5360758 (1994-11-01), Bronner et al.
patent: 5395786 (1995-03-01), Hsu et al.
patent: 5422294 (1995-06-01), Noble et al.
patent: 5470778 (1995-11-01), Nagata et al.
patent: 5525531 (1996-06-01), Bronner et al.
patent: 5656535 (1997-08-01), Ho et al.
patent: 5658816 (1997-08-01), Rajeevakumar
patent: 5692281 (1997-12-01), Rajeevakumar
patent: 5717628 (1998-02-01), Hammerl et al.
patent: 5827765 (1998-10-01), Stengl et al.
patent: 5937296 (1999-08-01), Arnold
Ozaki et al "0.228 um2 Trench Cell Tech With Bottle-Shaped Capacitor for lGbit DRAMS" IEDM 95, pp. 661-661-664.
Dobuzinsky David M.
Halle Scott D.
Hammerl Erwin
Ho Herbert Lei
Jaso Mark Anthony
Everhart Caridad
International Business Machines - Corporation
Neff Daryl K.
Yevsikov Victor
LandOfFree
Method of controllably forming a LOCOS oxide layer over a portio does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of controllably forming a LOCOS oxide layer over a portio, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of controllably forming a LOCOS oxide layer over a portio will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1724899