Method of 193 NM photoresist stabilization by the use of ion...

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device

Reexamination Certificate

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C430S322000, C430S327000

Reexamination Certificate

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06866986

ABSTRACT:
A method of forming a photoresist includes forming a photoresist and patterning/developing it according to conventional methods. The photoresist is then subjected to ion implantation. The ions may be selected from the group consisting of argon, boron, boron fluoride, arsenic, phosphorous and nitrogen. The ion implantation during processing of the photoresist provides a stabilized photoresist and helps reduce CD loss, loss of the photoresist and formation of pin holes and striations.

REFERENCES:
patent: 3666473 (1972-05-01), Colom et al.
patent: 4115128 (1978-09-01), Kita
patent: 4173470 (1979-11-01), Fahrenholtz et al.
patent: 6319655 (2001-11-01), Wong et al.
patent: 20020013055 (2002-01-01), Yamaguchi et al.
patent: 20030000920 (2003-01-01), Lee
patent: 20030045071 (2003-03-01), Hong et al.

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