Method for thinning a semiconductor wafer

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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156631, 156633, 156645, 156657, 156662, H01L 21306, B44C 122

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active

052680657

ABSTRACT:
A method for thinning a semiconductor wafer (11) is provided. An support film (15) is mounted to the semiconductor wafer (11). The support film (15) provides support for a semiconductor wafer during thinning as well as protection for a front-side (12) of the semiconductor wafer (11). After mounting the support film (15) to the semiconductor wafer (11), a back-side (13) of the semiconductor wafer is etched in a two step process. First the back-side (13) undergoes a mechanical grinding followed by a chemical etch. A metal film (18) may be sputtered on the back-side (13). The semiconductor wafer (11) having the support film (15) is placed in a tape frame (20) for dicing operations and the support film (15) is removed from the front-side (12) of the semiconductor wafer (11).

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patent: 3960623 (1976-06-01), Gantley
patent: 4310583 (1982-01-01), Baker et al.
patent: 4700467 (1987-10-01), Donzelli
patent: 4846931 (1989-07-01), Gmitter et al.
patent: 4983251 (1991-01-01), Haisma et al.
patent: 4994139 (1991-02-01), Biermann et al.
patent: 5127984 (1992-07-01), Hua et al.
"Mass Production Back-Grinding/Wafer-Thinning Technology for GaAs Devices", IEEE Transaction on Components, Hybrids, and Manufacturing Technology, vol. 13, No. 3, Sep. 1990.

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