4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Diffraction, reflection, or scattering analysis

Marc Friedrich

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Method for continuously measuring mechanical properties of a con

Metal deforming – With indication of condition or position of work – product,... – Work drawn or extruded through die
Patent

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Method for the on-line nondestructive measurement of a character

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Profile ID: LFUS-PAI-P-1305286

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