4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Diffraction, reflection, or scattering analysis

Jean-Lou Lebrun

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Method for the on-line nondestructive measurement of a character

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Method of manufacturing sheets made of alloy 718 for the...

Metal treatment – Process of modifying or maintaining internal physical... – With casting or solidifying from melt
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1305288

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