Method for testing a non-volatile memory

Details Method for testing a non-volatile memory Method for testing a non-volatile memory

2005-01-18

2005-01-18

Lamarre, Guy J. (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C711S103000, C365S185330

Reexamination Certificate

active

06845476

ABSTRACT:
The present invention discloses a method for testing a non-volatile memory, characterized in that the code assigned by the client is written in at least one non-volatile memory in advance, and then a particular pin of the non-volatile memory is cut, such as a write enabling pin for avoiding the mistake of rewriting. After restarting a testing machine, the code written in the non-volatile memory is read out to compare it with the code retrieved from a controlling program of the testing machine. If the comparing result is identical, it means that the code retrieved by the controlling program of the testing machine is correct; otherwise, the code retrieved by the controlling program is incorrect.

REFERENCES:
patent: 4654829 (1987-03-01), Jiang et al.
patent: 5079725 (1992-01-01), Geer et al.
patent: 6088284 (2000-07-01), Lee et al.
patent: 6133727 (2000-10-01), Chun et al.
patent: 6367042 (2002-04-01), Phan et al.

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