Method for reducing low frequency noise of transistor

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having junction gate

Reexamination Certificate

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C438S795000, C257S256000, C257S272000, C257SE21400

Reexamination Certificate

active

08048731

ABSTRACT:
A method for reducing low frequency noise of a transistor operable at cryogenic temperatures includes a first step in which the transistor is illuminated with a light in a state that the transistor is activated and flowed current by supplying a power at a predetermined temperature, and a second step in which the transistor is operated at the predetermined temperature after the illumination of the light.

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patent: 2003/0183750 (2003-10-01), Akiba
M. Fjuiwara, M. Sasaki and M. Akiba; Reduction method for low-frequency noise of GaAs junction field-effect transistor at a cryogenic temperature; Applied Physics Letters; vol. 80, No. 10, Mar. 11, 2002, pp. 1844-1846.
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