Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2006-08-08
2006-08-08
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C714S726000
Reexamination Certificate
active
07089136
ABSTRACT:
An electrical fuse circuit design for reducing the testing time for a semiconductor device manufactured with redundant eFuse circuitry. A two-to-one multiplexer (MUX) is provided at each eFuse circuit in addition to the fuse latch and pattern latch. Information on which fuse is to be blown is stored in the fuse's pattern latch. The output of the pattern latch is ANDed with a program input to provide a select signal for the MUX. Based on the select signal, the MUX allows the shifted “1” to either go to the next latch in the shift chain or bypass the next latch or latches in the shift chain when the next fuse(s) is not to be blown. Accordingly, the invention enables only those fuse latches associated with fuses that are to be blown to hold up the propagation of the shifted “1” to the next eFuse circuits.
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Anand Darren L.
Barth, Jr. John E.
Oakland Steven F.
Ouellette Michael R.
Baran Mary Catherine
Dillon & Yudell LLP
Henkler Richard A.
Hoff Marc S.
International Business Machines - Corporation
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