4. Static information storage and retrieval
  5. Read/write circuit
  6. Having particular data buffer or latch

Darren L. Anand

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Apparatus and method for improving sensing margin of...

Static information storage and retrieval – Read/write circuit – Having fuse element
Reexamination Certificate

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Automatic bit fail mapping for embedded memories with clock...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Circuitry and method for programming an electrically...

Miscellaneous active electrical nonlinear devices – circuits – and – Specific identifiable device – circuit – or system – Fusible link or intentional destruct circuit
Reexamination Certificate

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Circuitry and method for programming an electrically...

Miscellaneous active electrical nonlinear devices – circuits – and – Specific identifiable device – circuit – or system – Fusible link or intentional destruct circuit
Reexamination Certificate

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Column redundancy system and method for embedded DRAM...

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1867728

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