Method for production of semiconductor device

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C257S302000

Reexamination Certificate

active

07923332

ABSTRACT:
A method for producing a semiconductor device, the method includes the steps of: forming a hard mask layer with a mask opening on a semiconductor substrate in which is formed a source region; forming a side wall mask on the side wall of the mask opening; forming a trench by using the side wall mask and the hard mask layer as a mask in such a way that the trench reaches the source region; removing the side wall mask; forming a gate electrode inside the mask opening and the trench, with a gate insulating film interposed thereunder; forming a side wall on the side wall of the gate electrode; and forming a drain region on the surface of the semiconductor substrate which is adjacent to the gate electrode.

REFERENCES:
patent: 5504357 (1996-04-01), Kim et al.
patent: 6051469 (2000-04-01), Sheu et al.
patent: 6534367 (2003-03-01), Peake et al.
patent: 6716046 (2004-04-01), Mistry
patent: 2001/0024851 (2001-09-01), Kubo
patent: 2001/0038121 (2001-11-01), Kim et al.
patent: 2002/0013032 (2002-01-01), Ang et al.
patent: 2002/0031890 (2002-03-01), Watanabe et al.
patent: 2009/0197380 (2009-08-01), Lee
patent: 2006-013556 (2006-01-01), None

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