Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Electron beam imaging
Reexamination Certificate
2004-02-24
2010-02-02
Young, Christopher G (Department: 1795)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Electron beam imaging
C430S510000, C430S511000, C430S512000, C430S942000
Reexamination Certificate
active
07655381
ABSTRACT:
The invention relates to a method for producing a substrate having a resist layer in the form of a relief structure, which represents a diffraction structure. The resist layer at least in certain areas adjoins a conductive layer, which scatters the primary electrons and/or produces secondary electrons when the resist layer is exposed by means of an electron beam. With this method the material of the resist layer and the conductive layer and the exposure parameters are adjusted to each other such that the resist layer is also exposed outside the area impinged with the electron beam such that the flanks of the relief structure obtain an inclined form.
REFERENCES:
patent: 3961102 (1976-06-01), Ballantyne et al.
patent: 6344275 (2002-02-01), Katsumura et al.
patent: 6569578 (2003-05-01), Nozaki et al.
patent: 1341928 (2002-03-01), None
patent: 1156138 (2001-11-01), None
M. Gentili et al: “Fabrication of controlled slope attenuated phase-shift X-ray masks for 250 nm synchrotron lithography” Journal of Vacuum Science and Technology: Part B, American Institute of Physics, New York, US, vol. 12, No. 6, Nov. 1, 1994, pp. 3954-3958, XP000497202, ISSN: 1071-1023.
H. Itoh et al: “Charging effects on trilevel resist and metal layer in electron-beam lithograph”, Journal of Vacuum Science & Technology B, Microelectronics Processing and Phenomena, USA, vol. 9, No. 6, 1991, pp. 3039-3042, XP002303455, ISSN: 0734-211X.
Ernst-Bernhard Kley: “Continuous profile writing by electron and optical lithography”, Microelectronic Engineering, Elsevier Publishers BV., Amsterdam, NL, vol. 34, Dec. 1, 1997, pp. 261-298, XP004108294, ISSN: 0167-9317.
“Electron Beam/Optical Stepper Mixed Lithography” (Liu Ming, Chen Baoquin, Liu Xiao-wei, Wei Lin-peng, Wu De-xin; No. 1, Microfabrication Technology, 2002-2-3-31), pp. 13-17.
“Digital pixel hologram by means of e-beam lithography” (Wang tianji, Li Yaotang, Yang Shining, Zhang Shichao, Fan Shaowu, Wen Huanrong, W.H. Hong, N. K. Bao, E. Y. B. Pun, P.S. Chung, Laser Journal (vol. 20, No. 3, 1999), pp. 34, 35 and 57.
Bacon & Thomas PLLC
Giesecke & Devrient GmbH
Young Christopher G
LandOfFree
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