Method for producing a spacer structure

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S299000, C438S301000, C438S287000, C438S279000, C438S305000, C438S514000, C438S696000, C438S197000, C438S153000, C438S154000, C438S186000, C438S184000, C438S369000, C438S365000, C438S366000, C257SE21167

Reexamination Certificate

active

10519201

ABSTRACT:
A method for fabricating a spacer structure includes: forming a gate insulation layer having a gate deposition-inhibiting layer, a gate layer and a covering deposition-inhibiting layer on a semiconductor substrate, and patterning the gate layer and the covering deposition-inhibiting layer in order to form gate stacks. An insulation layer is deposited selectively using the deposition-inhibiting layers, thereby permitting highly accurate formation of the spacer structure.

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D. Widmann, H. Mader and H. Friedrich, “Technologie hochintegrierter Schaltungen” pp. 62-67, Jun. 1996.

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