Method for producing a multi-step structure in a substrate

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Forming nonplanar surface

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430314, 430317, 430313, 430324, 430329, 438948, 216 47, 216 18, G03F 700

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active

056353375

ABSTRACT:
A structure of openings is produced in two or more layers of silylated, polyimide photoresist. Openings in subsequent layers, which overlap previous openings, are of larger size. Then the structure is transferred to an organic substrate using oxygen plasma etching with up to 3% CF.sub.4. The smallest opening transferred to the substrate extends through the substrate.

REFERENCES:
patent: 3518084 (1970-06-01), Barson
patent: 5266446 (1993-11-01), Chang
IBM Technical Disclosure, vol. 33 No. 2, Jul. 1990, pp. 447-449, "Dual-Image Resist for Single-Exposure Self-Aligned Processing".
IBM Technical Disclosure Bulletin, vol. 32, No. 8A, Jan. 1990, pp. 218-219, "Method to Incorporate Three sets of Pattern Information in Two Photomasking Steps".

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