Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2010-09-10
2011-11-01
Nguyen, Ha Tran T (Department: 2829)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C257SE21440
Reexamination Certificate
active
08048751
ABSTRACT:
A gate dielectric, an insulating layer and an etching mask are formed on substrate. The etching mask delineates at least the gate electrode and the source and drain contacts and the source, drain and gate output lines of the first metal level of a field effect device. The gate electrode and the future source and drain contacts are formed simultaneously by etching of the insulating layer. A gate material is deposited to form the gate electrode. The source and drain contacts are formed at least in the insulating layer. The source, drain and gate output lines of the first metal level are formed in the etching mask.
REFERENCES:
patent: 6281051 (2001-08-01), Tsutsumi
patent: 6303449 (2001-10-01), Pan et al.
patent: 2009/0140431 (2009-06-01), Feustel et al.
Coronel Philippe
Fenouillet-Beranger Claire
Campbell Shaun
Commissariat a l''Energie Atomique
Nguyen Ha Tran T
Oliff & Berridg,e PLC
LandOfFree
Method for producing a field effect device having... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for producing a field effect device having..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for producing a field effect device having... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4268548