Method for preparing alumna coating film having alpha-type...

Chemistry: electrical and wave energy – Processes and products – Coating – forming or etching by sputtering

Reexamination Certificate

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C204S192120, C204S192130, C204S192150

Reexamination Certificate

active

07967957

ABSTRACT:
For forming alumina films on substrates by sputtering of an aluminum metal target in an oxidizing gas-containing atmosphere, a method of producing α crystal structure-based alumina films efficiently includes as an early film formation, forming films under conditions suited for formation of α crystal structure alumina. For example the forming forms films of αcrystal structure alumina in a poisoning mode discharge condition only in an early stage of film formation.

REFERENCES:
patent: 3911579 (1975-10-01), Lane et al.
patent: 5292417 (1994-03-01), Kugler
patent: 5693417 (1997-12-01), Goedicke et al.
patent: 5698314 (1997-12-01), Goedicke et al.
patent: 5789071 (1998-08-01), Sproul et al.
patent: 6217720 (2001-04-01), Sullivan et al.
patent: 6290825 (2001-09-01), Fu
patent: 0 719 874 (1996-07-01), None
patent: 63-62875 (1988-03-01), None
patent: 2-115359 (1990-04-01), None
patent: 4-136165 (1992-05-01), None
patent: 4-325680 (1992-11-01), None
patent: 8-176821 (1996-07-01), None
patent: 2742049 (1998-01-01), None
patent: 2001-234338 (2001-08-01), None
patent: 2001-335917 (2001-12-01), None
patent: 2001-342556 (2001-12-01), None
patent: 2002-53946 (2002-02-01), None
patent: 2002-212719 (2002-07-01), None
patent: 00/68452 (2000-11-01), None
Zywitzki, O. et al. “Effect of the substrate temperature on the structure and properties of Al2O3 layers reactively deposited by pulsed magnetron sputtering.” Surface and Coating Technology 82 pp. 169-175. 1996.
U.S. Appl. No. 11/174,551, filed Jul. 6, 2005, Kohara, et al.
U.S. Appl. No. 10/554,601, filed Oct. 27, 2005, Tamagaki, et al.
U.S. Appl. No. 10/551,993, filed Oct. 4, 2005, Tamagaki, et al.
European Search Report issued Sep. 6, 2010 in PCT/JP0310115.
Zywitzki O et al: “Influence of coating parameters on the structure and properties of A1203 layers reactively deposited by means of pulsed magnetron sputtering” Surface and Coatings Technology Elsevier Switzerland, vol. 86-87, No. 1-3, Dec. 15, 1996, pp. 640-647, XP002597919, ISSN: 0257-8972, figure 1: table 1, p. 642, right-hand column, paragraph 2.

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