Method for patterning film and method for exposing resist film

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Electron beam imaging

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Details

430313, 430327, 430942, 2504923, G03C 500

Patent

active

060486686

ABSTRACT:
Patterning a film by accumulating a first electric charge in a first area of a film under treatment, applying a resist to the film, and subsequently exposing a second area of the resist adjoining the first area to the first electric charge.

REFERENCES:
patent: 4702993 (1987-10-01), White et al.
patent: 4976818 (1990-12-01), Hashimoto et al.

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