Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Electron beam imaging
Patent
1998-11-13
2000-05-30
Young, Christopher G.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Electron beam imaging
G03C 500
Patent
active
060689641
ABSTRACT:
A process for patterning an insulator film formed on a semiconductor substrate forms contact holes in the insulator film and also exposes a portion of the semiconductor substrate. The exposed portion is used for grounding the substrate during an electron beam irradiation step to an overlying insulator film for preventing the charge-up of the interface between the insulator film and the substrate.
REFERENCES:
patent: 5091285 (1992-02-01), Watanabe et al.
patent: 5288368 (1994-02-01), De Marco et al.
NEC Corporation
Young Christopher G.
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