Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Patent
1996-01-18
1997-05-06
Hantis, K.
Optics: measuring and testing
By dispersed light spectroscopy
With sample excitation
G01J 330
Patent
active
056276400
ABSTRACT:
The present invention relates to a method for measuring radical species distribution in plasma by determining the intensity of the light emitted from the radical species and plasma parameters in plasma with the aid of optical and electrostatic probes, and an apparatus for measuring the radical species distribution. The method of the invention comprises the steps of: (i) measuring integral light intensity in a vacuum container by an optical probe inserted to the vacuum container; (ii) determining light intensity at each point of the vacuum container by differentiating the integral light intensity; (iii) measuring current and voltage applied to the electrostatic probe in the vacuum container; (iv) determining plasma parameters from the measured current and voltage; and, (v) measuring distribution of radical species from the light intensity and plasma parameters.
REFERENCES:
Lee, P.W. et al., "In Situ Monitoring of the Relative Distribution of Radicals by a Two Probes System", Rev. Sci. Instrum., 66(9), pp. 4591-4594, (Sep. 1995).
Rogoff, G. L., "Optical System for Spatial Discrimination of Radiation from Extended Bodies", Applied Optics, 8(3), pp. 723-724 (Mar. 1969).
Chang Hong-Young
Kim Yong-jin
Lee Pyung-Woo
Hantis K.
Korea Advanced Institute of Science and Technology
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