Method for manufacturing SOI substrate

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Total dielectric isolation

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S458000, C257SE21568, C257SE21122

Reexamination Certificate

active

08003483

ABSTRACT:
Forming an insulating film on a surface of the single crystal semiconductor substrate, forming a fragile region in the single crystal semiconductor substrate by irradiating the single crystal semiconductor substrate with an ion beam through the insulating film, forming a bonding layer over the insulating film, bonding a supporting substrate to the single crystal semiconductor substrate by interposing the bonding layer between the supporting substrate and the single crystal semiconductor substrate, dividing the single crystal semiconductor substrate at the fragile region to separate the single crystal semiconductor substrate into a single crystal semiconductor layer attached to the supporting substrate, performing first dry etching treatment on a part of the fragile region remaining on the single crystal semiconductor layer, performing second dry etching treatment on a surface of the single crystal semiconductor layer subjected to the first etching treatment, and irradiating the single crystal semiconductor layer with laser light.

REFERENCES:
patent: 5374564 (1994-12-01), Bruel
patent: 6127702 (2000-10-01), Yamazaki et al.
patent: 6143628 (2000-11-01), Sato et al.
patent: 6191007 (2001-02-01), Matsui et al.
patent: 6251754 (2001-06-01), Ohshima et al.
patent: 6271101 (2001-08-01), Fukunaga
patent: 6335231 (2002-01-01), Yamazaki et al.
patent: 6372609 (2002-04-01), Aga et al.
patent: 6380046 (2002-04-01), Yamazaki
patent: 6388652 (2002-05-01), Yamazaki et al.
patent: 6468923 (2002-10-01), Yonehara et al.
patent: 6534380 (2003-03-01), Yamauchi et al.
patent: 6602761 (2003-08-01), Fukunaga
patent: 6686623 (2004-02-01), Yamazaki
patent: 6778164 (2004-08-01), Yamazaki et al.
patent: 6803264 (2004-10-01), Yamazaki et al.
patent: 6855584 (2005-02-01), Yamazaki et al.
patent: 6875633 (2005-04-01), Fukunaga
patent: 6884694 (2005-04-01), Park et al.
patent: 7015083 (2006-03-01), Yamazaki et al.
patent: 7119365 (2006-10-01), Takafuji et al.
patent: 7176525 (2007-02-01), Fukunaga
patent: 7199024 (2007-04-01), Yamazaki
patent: 7256776 (2007-08-01), Yamazaki et al.
patent: 7291523 (2007-11-01), Yamazaki et al.
patent: 7338882 (2008-03-01), Park et al.
patent: 7354844 (2008-04-01), Endo et al.
patent: 7364984 (2008-04-01), Endo et al.
patent: 7416960 (2008-08-01), Endo et al.
patent: 2001/0019877 (2001-09-01), Miyake et al.
patent: 2002/0070454 (2002-06-01), Yasukawa
patent: 2004/0061176 (2004-04-01), Takafuji et al.
patent: 2004/0104424 (2004-06-01), Yamazaki
patent: 2005/0009252 (2005-01-01), Yamazaki et al.
patent: 2005/0014346 (2005-01-01), Mitani et al.
patent: 2006/0035440 (2006-02-01), Ghyselen et al.
patent: 2007/0063281 (2007-03-01), Takafuji et al.
patent: 2007/0093039 (2007-04-01), Kerdiles et al.
patent: 2007/0108510 (2007-05-01), Fukunaga
patent: 2007/0173000 (2007-07-01), Yamazaki
patent: 2007/0184632 (2007-08-01), Yamazaki et al.
patent: 2007/0232025 (2007-10-01), Moriceau et al.
patent: 2007/0281172 (2007-12-01), Couillard et al.
patent: 2007/0291022 (2007-12-01), Yamazaki et al.
patent: 2008/0138963 (2008-06-01), Yamazaki et al.
patent: 2008/0268263 (2008-10-01), Yamazaki
patent: 2008/0286937 (2008-11-01), Mitani
patent: 2009/0075456 (2009-03-01), Akimoto et al.
patent: 2009/0098704 (2009-04-01), Ohnuma et al.
patent: 1 039 513 (2000-09-01), None
patent: 1 045 448 (2000-10-01), None
patent: 1 688 990 (2006-08-01), None
patent: 02-054532 (1990-02-01), None
patent: 11-097379 (1999-04-01), None
patent: 11-163363 (1999-06-01), None
patent: 2000-124092 (2000-04-01), None
patent: 2000-349266 (2000-12-01), None
patent: 2003-173968 (2003-06-01), None
patent: 2004-080035 (2004-03-01), None
patent: 2004-087606 (2004-03-01), None
patent: 2005-203596 (2005-07-01), None
patent: 2005-252244 (2005-09-01), None
patent: 2006-216807 (2006-08-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for manufacturing SOI substrate does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for manufacturing SOI substrate, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for manufacturing SOI substrate will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2630972

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.