Method for manufacturing semiconductor device that includes...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S197000, C438S223000

Reexamination Certificate

active

06929994

ABSTRACT:
A method is provided for manufacturing a semiconductor device having a high breakdown voltage transistor and a low breakdown voltage transistor with different driving voltages in a common substrate. The method includes: (a) introducing an impurity of a second conductivity type in a specified region of a semiconductor substrate of a first conductivity type to form a first impurity layer and a second impurity layer; (b) further introducing an impurity of the second conductivity type in a region of the second impurity layer to form a third impurity layer; and (c) conducting a heat treatment to diffuse impurities of the first impurity layer and the third impurity layer to form a first well of the second conductivity type and a second well of the second conductivity type having an impurity concentration higher than the first well.

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