Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-12-12
2006-12-12
Lebentritt, Michael (Department: 2812)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S589000, C257SE21429
Reexamination Certificate
active
07148112
ABSTRACT:
Disclosed is a method for manufacturing a semiconductor device. The method includes the steps of preparing a semiconductor substrate, forming a buffer oxide layer, forming a hard mask layer on the buffer oxide layer, etching an exposed portion of the buffer oxide layer by using the hard mask layer, etching a substrate active area of an exposed recess channel forming area by using the isolation layer as an etching mask, removing a remaining buffer oxide layer, sequentially forming a gate oxide layer and a gate conductive layer on a resultant structure, etching the gate conductive layer and the gate oxide layer, thereby forming a gate, and forming a source/drain area in the substrate active area.
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Hynix / Semiconductor Inc.
Ladas & Parry LLP
Lebentritt Michael
Pompey Ron
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