Method for manufacturing semiconductor device and...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Details

C438S224000, C438S227000, C438S228000, C257S335000

Reexamination Certificate

active

07972917

ABSTRACT:
A method for manufacturing a semiconductor device is disclosed. The method includes: forming a LDMOS region, an offset drain MOS region, and a CMOS region; simultaneously forming a first well in the LDMOS region and the offset drain MOS region; simultaneously forming a second well in the first well of the LDMOS region and the CMOS region; and forming a second well in the CMOS region, wherein a depth of the first well is larger than a depth of the second well and the second well is a retrograde well formed by a high energy ion implantation method.

REFERENCES:
patent: 4918026 (1990-04-01), Kosiak et al.
patent: 5262345 (1993-11-01), Nasser et al.
patent: 5981997 (1999-11-01), Kitamura
patent: 6097078 (2000-08-01), Sim et al.
patent: 6451640 (2002-09-01), Ichikawa
patent: 6461946 (2002-10-01), Kitani et al.
patent: 6664602 (2003-12-01), Yamashita et al.
patent: 6903424 (2005-06-01), Ookubo et al.
patent: 7009259 (2006-03-01), Ookubo et al.
patent: 7015551 (2006-03-01), Ookubo et al.
patent: 2006/0011975 (2006-01-01), Yonemoto et al.
patent: 03-201474 (1991-09-01), None
patent: 09-260651 (1997-10-01), None
patent: 10-189762 (1998-07-01), None
patent: 2002-026274 (2002-01-01), None
patent: 2002-100684 (2002-04-01), None
patent: 2003-060073 (2003-02-01), None
patent: 2003-234423 (2003-08-01), None
patent: 2005-056915 (2005-03-01), None
patent: 2006-032493 (2006-02-01), None
patent: 2006-210532 (2006-08-01), None

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