Method for manufacturing semiconductor device

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Details

C438S369000, C438S373000, C438S514000, C438S519000

Reexamination Certificate

active

07655526

ABSTRACT:
Disclosed is a method for manufacturing a semiconductor device. The method for manufacturing a semiconductor device includes the steps of forming a gate electrode on a semiconductor substrate, forming a drift area in the semiconductor substrate by implanting a dopant using the gate electrode as a mask, forming a sidewall spacer at sides of the gate electrode, and forming a source/drain area in the semiconductor substrate by implanting a dopant using the gate electrode and the sidewall spacer as a mask.

REFERENCES:
patent: 6010926 (2000-01-01), Rho et al.
patent: 7112837 (2006-09-01), Hsu et al.
patent: 2005/0151207 (2005-07-01), Moscatelli et al.
patent: 2005/0205926 (2005-09-01), Chen et al.
patent: 10-2005-0101616 (2005-10-01), None
Ki Ju Baek; “Method of Manufacturing Power Mosfet Using Enhanced Arrangement of LDD Region for Reducing On-Resistance without Degradation of Breakdown Voltage Characteristics”; Korean Patent Abstracts; Publication No. 1020050101616 A; Publication Date: Oct. 25, 2005; Korean Intellectual Property Office, Republic of Korea.
Korean Office Action dated Nov. 14, 2006; Korean Patent Application No. 10-2005-0132334; Korean Intellectual Property Office, Republic of Korea.

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