Method for manufacturing semiconductor device

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S223000, C438S227000, C438S228000, C438S514000, C438S522000, C438S519000, C438S546000

Reexamination Certificate

active

07005340

ABSTRACT:
A method is provided for manufacturing a semiconductor device that can reduce the number of steps in manufacturing a triple-well that includes multiple ion implantation steps and heat treatment steps. The method comprises the steps of: (a) forming a first mask layer having a first opening section on a semiconductor substrate; (b) forming a first dielectric layer on an exposed surface of the semiconductor substrate in the first opening section; (c) forming an impurity layer by introducing a first impurity of a second conductivity type in the semiconductor substrate through the first dielectric layer; (d) conducting a heat treatment to form a first well, and a second dielectric layer on the exposed surface of the semiconductor substrate in the first opening section; (e) forming a second mask layer having a second opening section on the first mask layer; and (f) forming a second well within the first well by introducing a second impurity of the first conductivity type in the semiconductor substrate through the second dielectric layer.

REFERENCES:
patent: 4268321 (1981-05-01), Meguro
patent: 4584027 (1986-04-01), Metz et al.
patent: 4697332 (1987-10-01), Joy et al.
patent: 5663086 (1997-09-01), Rostoker et al.
patent: 5698458 (1997-12-01), Hsue et al.
patent: 5702988 (1997-12-01), Liang
patent: 6063690 (2000-05-01), Woodruff et al.
patent: 6097078 (2000-08-01), Sim et al.
patent: 6342719 (2002-01-01), Arai
patent: 6459104 (2002-10-01), Schuegraf
patent: 6531356 (2003-03-01), Hayashi
patent: 01-268171 (1989-10-01), None
patent: 07-078881 (1995-03-01), None
patent: 08-274268 (1996-10-01), None
patent: 2000-286346 (2000-10-01), None
patent: 2000-294742 (2000-10-01), None
patent: 2001-291678 (2001-10-01), None
patent: 2001-291679 (2001-10-01), None
patent: 2001-291786 (2001-10-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for manufacturing semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for manufacturing semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for manufacturing semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3647279

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.