Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-12-04
2007-12-04
Nguyen, Thanh (Department: 2813)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C257SE21690
Reexamination Certificate
active
11137895
ABSTRACT:
Disclosed is a method for manufacturing a NAND flash device. After a source line plug hole is formed, a drain contact plug hole is formed. The holes are filled with a conductive material film and are then polished. It is therefore possible to simplify the process since a blanket etch process step is omitted. Moreover, loss of a drain contact plug by the blanket etch process is prevented. It is therefore possible to improve the electrical properties of a device and reduce the manufacturing cost price.
REFERENCES:
patent: 6115287 (2000-09-01), Shimizu et al.
patent: 6930001 (2005-08-01), Gil
patent: 7223655 (2007-05-01), Gil
patent: 2003/0085421 (2003-05-01), Takeuchi et al.
Hynix / Semiconductor Inc.
Marshall & Gerstein & Borun LLP
Nguyen Thanh
LandOfFree
Method for manufacturing NAND flash device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for manufacturing NAND flash device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for manufacturing NAND flash device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3889169