Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Patent
1999-03-16
1999-10-26
Bowers, Charles
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
438306, 438279, 438595, 438976, H01L 21336
Patent
active
059727640
ABSTRACT:
A method for manufacturing a metal-oxide-semiconductor (MOS) transistor is described. In the invention, doped regions of the local pocket type are formed in the substrate after the source/drain terminals of a MOS transistor in the logic circuit area are formed. The method includes the steps of forming an insulation layer over the entire substrate. Then, a portion of the insulation layer is removed to expose the spacers on the sidewalls of the gate electrode. Subsequently, the spacers are removed, and then an ion implantation operation is conducted to implant dopants into the substrate through the windows formed by the uprooted spacers. Ultimately, doped regions of the local pocket type are formed in the substrate under the lightly doped drain source/drain terminals of a MOS transistor.
REFERENCES:
patent: 5234850 (1993-08-01), Liao
patent: 5595919 (1997-01-01), Pan
patent: 5736446 (1998-04-01), Wu
Huang Hsiu-Wen
Sze Jhy-Jyi
Bowers Charles
Chen Jack
Huang Jiawei
United Semiconductor Corp.
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