Method for manufacturing improved sidewall structures for...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Reexamination Certificate

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07018888

ABSTRACT:
The present invention provides a method for manufacturing a semiconductor device and method for manufacturing an integrated circuit including the semiconductor device. The method for manufacturing a semiconductor device (100), among other steps, includes forming a gate structure (130) over a substrate (110), the gate structure (130) having sidewall spacers (210or410) on opposing sidewalls thereof and placing source/drain implants (310, 510) into the substrate (110) proximate the gate structure (130). The method further includes removing at least a portion of the sidewall spacers (210or410) and annealing the source/drain implants (310, 510) to form source/drain regions (710) after removing the at least a portion of the sidewall spacers (210or410).

REFERENCES:
patent: 5498555 (1996-03-01), Lin
patent: 5607884 (1997-03-01), Byun
patent: 5920774 (1999-07-01), Wu
patent: 6187620 (2001-02-01), Fulford et al.
patent: 6337240 (2002-01-01), Chu
patent: 6660605 (2003-12-01), Liu
patent: 6797576 (2004-09-01), Teng et al.
patent: 6806149 (2004-10-01), Bu et al.
patent: 6902966 (2005-06-01), Yu et al.
patent: 2003/0082880 (2003-05-01), Yu et al.
patent: 2004/0126976 (2004-07-01), Cho
patent: 2005/0059260 (2005-03-01), Bu et al.

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