Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2011-02-08
2011-02-08
Maldonado, Julio J (Department: 2823)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S257000, C257SE21626, C257SE21640, C257SE21302
Reexamination Certificate
active
07883981
ABSTRACT:
Embodiments relate to a flash memory device and a method for manufacturing a flash memory device. According to embodiments, a method may include forming a gate on and/or over a semiconductor substrate on and/or over which a device isolation film may be formed, forming a first spacer including a first oxide pattern and a first nitride pattern on and/or over side walls of the gate, forming a source and drain area on and/or over the semiconductor substrate using the gate and spacer as masks, removing the first nitride pattern of the first spacer, and forming a second spacer including a second oxide film pattern and a second nitride film pattern on and/or over the side walls of the gate by performing an annealing process on and/or over the semiconductor substrate on and/or over which the first oxide film pattern is formed.
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Dongbu Hi-Tek Co., Ltd.
Maldonado Julio J
Scarlett Shaka
Sherr & Vaughn, PLLC
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