Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Patent
1999-04-01
2000-10-31
Bowers, Charles
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
438183, 438184, H01L 21336
Patent
active
061401692
ABSTRACT:
A GaN-type field effect transistor exhibits a large input amplitude by using a gate insulating film. A channel layer and a gate insulating film are sequentially laminated on a substrate with a buffer layer therebetween. A gate electrode is formed on the gate insulating film. A source electrode and a drain electrode are disposed at the both sides of the gate electrode and are electrically connected to the channel layer via openings. The channel layer is formed from n-type GaN. The gate insulating film is made from AlN, which exhibits excellent insulation characteristics, thus increasing the Schottky barrier and achieving a large input amplitude. If the FET is operated in the enhancement mode, it is operable in a manner similar to a Si-MOS-type FET, resulting in the formation of an inversion layer.
REFERENCES:
patent: 4030942 (1977-06-01), Keenan et al.
patent: 4642879 (1987-02-01), Kawata et al.
patent: 4843024 (1989-06-01), Ito
patent: 5447874 (1995-09-01), Grivna et al.
Imanaga Shunji
Kawai Hiroji
Bowers Charles
Christianson Keith
Sony Corporation
LandOfFree
Method for manufacturing field effect transistor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for manufacturing field effect transistor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for manufacturing field effect transistor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2050455