Method for manufacturing cell transistor

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S413000

Reexamination Certificate

active

11039243

ABSTRACT:
Disclosed herein is a method of manufacturing a cell transistor which can achieve an improvement in a short-channel effect of a cell transistor as well as an improvement in a refresh characteristic of the transistor, and can also prevent a reduction in the threshold voltage of the transistor, in relation to DRAM memory cells with high integration. The method comprises the steps of forming a device isolation region, which defines a device separating region, on a silicon substrate, forming a barrier layer on the substrate formed with device isolation region, forming a hard mask, which defines a gate forming region, on the substrate formed with the barrier layer, forming a silicon epitaxial layer on a surface of the substrate through selective epitaxial growth of silicon constituting the surface of the substrate, formed with the hard mask and the barrier layer, and removing the hard mask.

REFERENCES:
patent: 5223447 (1993-06-01), Lee et al.
patent: 6693018 (2004-02-01), Kim et al.
patent: 6852559 (2005-02-01), Kwak et al.
patent: 6858490 (2005-02-01), Kim
patent: 2004/0126987 (2004-07-01), Kim

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for manufacturing cell transistor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for manufacturing cell transistor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for manufacturing cell transistor will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3893787

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.