Method for manufacturing a semiconductor device

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Details

C257SE21410, C257S302000, C257S329000, C257S334000, C257S330000

Reexamination Certificate

active

07923329

ABSTRACT:
A method for manufacturing a semiconductor device includes forming a spin-on-carbon (SOC) film that facilitates a low temperature baking process, can prevent collapse of vertical transistors while forming a bit line, thereby providing a more simple manufacturing method and improving manufacturing yields.

REFERENCES:
patent: 5756237 (1998-05-01), Amemiya
patent: 6107133 (2000-08-01), Furukawa et al.
patent: 7348628 (2008-03-01), Yoon et al.
patent: 2003/0169629 (2003-09-01), Goebel et al.
patent: 2005/0014667 (2005-01-01), Aoyama et al.
patent: 2008/0213544 (2008-09-01), Devadoss et al.
patent: 2008/0292995 (2008-11-01), Houlihan et al.
patent: 1230026 (1999-09-01), None
patent: 0 948 053 (1999-10-01), None
patent: 10-0734313 (2007-06-01), None
patent: 10-2007-0109651 (2007-11-01), None

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