Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2005-11-01
2005-11-01
Nelms, David (Department: 2818)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S594000, C438S954000
Reexamination Certificate
active
06960505
ABSTRACT:
A memory layer intended for trapping charge carriers over a source region and a drain region is interrupted over the channel so that a diffusion of the charge carriers, which are trapped over the source region and over the drain region, is prevented. The memory layer is limited to regions over the parts of the source region and of the drain region facing the channel and is embedded all around in oxide.
REFERENCES:
patent: 5408115 (1995-04-01), Chang
patent: 5768192 (1998-06-01), Eitan
patent: 5796140 (1998-08-01), Tomioka
patent: 5877523 (1999-03-01), Liang et al.
patent: 5969383 (1999-10-01), Chang et al.
patent: 6348380 (2002-02-01), Weimer et al.
patent: 6574143 (2003-06-01), Nakazato
patent: 2000058680 (2000-02-01), None
patent: WO 99/49518 (1999-09-01), None
Hofmann Franz
Willer Josef
Greenberg Laurence A.
Hoang Quoc
Locher Ralph E.
Stemer Werner H.
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