Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Patent
1998-06-25
2000-04-11
Niebling, John F.
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
On insulating substrate or layer
438225, 438233, 438297, 438586, H01L 2100, H01L 218234, H01L 21336, H01L 213205
Patent
active
060487569
ABSTRACT:
Disclosed is a method for manufacturing a metal-oxide-semiconductor (MOS) device formed in an epitaxial silicon layer on insulator substrate comprising the steps of forming a field oxide layer defined an active region of the MOS device in the silicon layer and forming a gate oxide on the silicon layer; forming a gate electrode on the gate oxide, and self-aligned implanting a dopant of low concentration to form a lightly doped drain region; forming an oxide spacer in both sides of the gate electrode; growing a SiGe epitaxial layer having a lower bandgap than the silicon layer on the portion of the exposed silicon layer; and implanting a dopant of high concentration over the SiGe epitaxial layer to form a highly doped source/drain region. This invention can easily manufacture an SOI MOS device having a low source/drain series resistance and a high breakdown voltage without additional complex processes.
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Kim Bo Woo
Lee Jong Ho
Lyu Jong Son
Electronics and Telecommunications Research Institute
Lebentritt Michael S.
Niebling John F.
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