Method for making a semiconductor device comprising a...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S197000

Reexamination Certificate

active

07018900

ABSTRACT:
A method for making a semiconductor device may include providing a semiconductor substrate and forming at least one metal oxide semiconductor field-effect transistor (MOSFET). The at least one MOSFET may be formed by forming a superlattice channel including a plurality of stacked groups of layers on the semiconductor substrate. Each group of layers of the superlattice channel may include a plurality of stacked base semiconductor monolayers defining a base semiconductor portion and an energy band-modifying layer thereon. The energy-band modifying layer may include at least one non-semiconductor monolayer constrained within a crystal lattice of adjacent base semiconductor. The method may further include forming a gate overlying the superlattice channel, and forming source and drain regions in the semiconductor substrate on opposing sides of the superlattice channel so that the superlattice channel has upper surface portions vertically stepped above adjacent upper surface portions of the source and drain regions.

REFERENCES:
patent: 4485128 (1984-11-01), Dalal et al.
patent: 4594603 (1986-06-01), Holonyak, Jr.
patent: 4882609 (1989-11-01), Schubert et al.
patent: 4908678 (1990-03-01), Yamazaki
patent: 4937204 (1990-06-01), Ishibashi et al.
patent: 4969031 (1990-11-01), Kobayashi et al.
patent: 5081513 (1992-01-01), Jackson et al.
patent: 5216262 (1993-06-01), Tsu
patent: 5357119 (1994-10-01), Wang et al.
patent: 5606177 (1997-02-01), Wallace et al.
patent: 5683934 (1997-11-01), Candelaria
patent: 5684817 (1997-11-01), Houdre et al.
patent: 5994164 (1999-11-01), Fonash et al.
patent: 6058127 (2000-05-01), Joannopoulos et al.
patent: 6255150 (2001-07-01), Wilk et al.
patent: 6274007 (2001-08-01), Smirnov et al.
patent: 6281518 (2001-08-01), Sato
patent: 6281532 (2001-08-01), Doyle et al.
patent: 6326311 (2001-12-01), Ueda et al.
patent: 6344271 (2002-02-01), Yadav et al.
patent: 6350993 (2002-02-01), Chu et al.
patent: 6376337 (2002-04-01), Wang et al.
patent: 6436784 (2002-08-01), Allam
patent: 6472685 (2002-10-01), Takagi
patent: 6498359 (2002-12-01), Schmidt et al.
patent: 6501092 (2002-12-01), Nikonov et al.
patent: 6521549 (2003-02-01), Kamath et al.
patent: 6566679 (2003-05-01), Nikonov et al.
patent: 6621097 (2003-09-01), Nikonov et al.
patent: 2003/0034529 (2003-02-01), Fitzgerald et al.
patent: 2003/0057416 (2003-03-01), Currie et al.
patent: 2003/0162335 (2003-08-01), Yuki et al.
patent: 2003/0215990 (2003-11-01), Fitzgerald et al.
patent: 0 843 361 (1998-05-01), None
patent: 2347520 (2000-09-01), None
patent: 61145820 (1986-07-01), None
patent: 61220339 (1986-09-01), None
patent: 99/63580 (1999-12-01), None
patent: 02/103767 (2002-12-01), None
Luo et al.,Chemical Design of Direct-Gap Light-Emitting Silicon, published Jul. 25, 2002, The American Physical Society; vol. 89, No. 7.
Tsu,Phenomena in Silicon Nanostructure Devices, University of North Carolina at Charlotte, Sep. 6, 2000.
Ye et al.,GaAs MOSFET with Oxide Gate Dielectric Grown by Atomic Layer Deposition, Agere Systems, Mar. 2003.
Novikov et al.,Silicon-based Optoelectronics, 1999-2003, pp. 1-6.
Patent Abstracts of Japan, vol. 012, No. 080 (E-590), Mar. 12, 1988 & JP 62 219665 A (Fujitsu Ltd), Sep. 26, 1987 abstract.
Patent Abstracts of Japan, vol. 010, No. 179 (E-414), Jun. 24, 1986 & JP 61 027681 A (Res Dev Corp of Japan), Feb. 7, 1986 abstract.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for making a semiconductor device comprising a... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for making a semiconductor device comprising a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for making a semiconductor device comprising a... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3561825

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.