Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates – Thinning of semiconductor substrate
Reexamination Certificate
2011-02-22
2011-02-22
Picardat, Kevin M (Department: 2822)
Semiconductor device manufacturing: process
Bonding of plural semiconductor substrates
Thinning of semiconductor substrate
C438S455000, C438S456000, C438S458000, C438S977000, C414S935000, C414S936000, C414S939000, C414S941000
Reexamination Certificate
active
07892947
ABSTRACT:
A workpiece machining method includes attaching a workpiece to a workpiece support with the aid of joining means. The workpiece and the workpiece support are joined to one another by an annular joining means. The composite produced is machined. The machined workpiece is separated from the workpiece support.
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Unpublished Japanese priority document for U.S. 7,115,485, filed in Japan on Sep. 26, 2003, English translation provided.
Bradl Stephen
Grommes Walther
Kröninger Werner
Melzl Michael
Schwaiger Josef
Au Bac H
Brinks Hofer Gilson & Lione
Infineon - Technologies AG
Picardat Kevin M
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