Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-06-20
2006-06-20
Nguyen, Vinh P. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010
Reexamination Certificate
active
07064570
ABSTRACT:
A method for improving the signal-to-noise ratio in an IDDQdefect test is disclosed. An integrated circuit is divided into a plurality of areas and each area is provided with and bounded by terminals. An IDDQdefect is activated to generate IDDQdefect current within the integrated circuit. An amount of IDDQdefect current generated within each area is measured at the terminals provided thereto. Based on the IDDQcurrent measurement on each area, an IDDQcurrent map is created. By analyzing the IDDQcurrent map, the presence and location of the defect is determined. Based on the determination, the IDDQdefect is isolated.
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Buffet Patrick H.
Heaberlin Douglas C.
Pastel Leah M. P.
Sun Yu H.
International Business Machines - Corporation
Nguyen Vinh P.
Walsh Robert A.
Whitham Curtis & Christofferson, P.C.
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