Method for locally and globally planarizing chemical vapor depos

Coating processes – Direct application of electrical – magnetic – wave – or... – Plasma

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427578, 427533, 4272557, 4274192, 156643, 156653, 437195, 437228, 437238, 437978, B05D 306, H01L 2102

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active

053993896

ABSTRACT:
In the ozone-activated deposition of insulating layers, different growth rates can be achieved on differently constituted surfaces. When the surfaces of the structured silicon substrates lying at different levels are differently constituted or, respectively, are intentionally varied such that the SiO.sub.2 insulating layer grows more slowly on the higher surfaces than on the more deeply disposed surfaces and when deposition is carried out until the surfaces of the rapidly growing and slowly growing layer regions form a step-free, planar level, a local and global planarization is achieved.

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T. H. Daubenspeck et al., "Planarization of ULSI Topography over Variable Pattern Densities", J. Electrochem. Soc., vol. 138, No. 2, Feb. 1991, pp. 506-509.
K. Fujino et al., "Reaction Mechanism of TEOS and O.sub.3 Atmospheric Pressure CVD", Semiconductor Process Laboratory, Jun. 11-12, 1991, VMIC Conference, pp. 445-447.
D. Widmann et al., "Technologie Hochintegrierter Schaultungen", Springer-Verlag 1988, Section 3.5.5, pp. 78-81.

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