Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-02-28
2006-02-28
Chaudhari, Chandra (Department: 2891)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S589000
Reexamination Certificate
active
07005353
ABSTRACT:
A method for reducing miller capacitance and switching losses in an integrated circuit includes providing a switching gate electrode having respective portions that are coplanar with the source and well regions of the integrated circuit. The switching gate electrode is configured for switching the integrated circuit on and off in response to a relatively small change in applied voltage. A shielding gate electrode is formed with respective portions coplanar with the switching electrode and the well region. The shielding electrode is configured for charging the gate-to-drain overlap region of the integrated circuit.
REFERENCES:
patent: 4735914 (1988-04-01), Hendrickson et al.
patent: 4941026 (1990-07-01), Temple
patent: 6285060 (2001-09-01), Korec et al.
Elbanhawy Alan
Kocon Christopher B.
Chaudhari Chandra
Fairchild Semiconductor Corporation
Fitzgerald, Esq. Thomas R.
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