Method for implementing deterministic based broken scan...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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C714S738000

Reexamination Certificate

active

07395469

ABSTRACT:
A method, apparatus and computer program product are provided for implementing deterministic based broken scan chain diagnostics. A deterministic test pattern is generated and is loaded into each scan chain in the device under test using lateral insertion via system data ports applying system clocks. Then each scan chain is unloaded and a last switching latch is identified. The testing steps are repeated a selected number of times. Then checking for consistent results is performed. When consistent results are identified, then the identified last switching latch is sent to a Physical Failure Analysis system.

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