Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2008-11-05
2009-10-27
Tu, Christine T (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C703S013000
Reexamination Certificate
active
07610540
ABSTRACT:
Disclosed is a logic testing system that includes a decompressor and a tester in communication with the decompressor. The tester is configured to store a seed and locations of scan inputs and is further configured to transmit the seed and the locations of scan inputs to the decompressor. The decompressor is configured to generate a test pattern from the seed and the locations of scan inputs. The decompressor includes a first test pattern generator, a second test pattern generator, and a selector configured to select the test pattern generated by the first test pattern generator or the test pattern generated by the second test pattern generator using the locations of scan inputs.
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Balakrishnan Kedarnath
Chakradhar Srimat T.
Wang Seongmoon
Wei Wenlong
Kolodka Joseph J.
NEC Laboratories America, Inc.
Tu Christine T
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