Method for forming via-hole in semiconductor device

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C257S744000, C257SE21578

Reexamination Certificate

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07569481

ABSTRACT:
Disclosed is a method for forming a via-hole for interconnection of metallization and/or metal wires in a semiconductor device. The present method may include the steps of: (a) forming an insulating layer on a semiconductor substrate including a lower metallization and/or metal wiring; (b) forming a mask (e.g., a photo-resist pattern) on the insulating layer; (c) dry etching the insulating layer using the photo-resist pattern as a mask to form a via-hole in the insulating layer; and (d) in the same dry etching chamber, etching a top portion of the insulating layer in the vicinity of the via-hole with an etchant comprising oxygen and argon.

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patent: 4750980 (1988-06-01), Hynecek
patent: 6642153 (2003-11-01), Chang et al.
patent: 6797633 (2004-09-01), Jiang et al.
patent: 2002/0081855 (2002-06-01), Jiang et al.
patent: 2004/0002213 (2004-01-01), Peng
patent: 2004/0142535 (2004-07-01), Chung
patent: 2005/0101123 (2005-05-01), Kumada et al.
patent: 2005/0269709 (2005-12-01), Merchant et al.
patent: 2006/0102197 (2006-05-01), Chiang et al.

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