Method for forming side contact in a semiconductor device

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

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438625, 438635, 438648, H01L 214763

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active

058638334

ABSTRACT:
A method of forming a side contact in a semiconductor device wherein a first insulating layer, first conductive and second insulating layer are formed over a substrate, and a contact hole through these layers exposes a portion of the substrate and a side edge of the first conductive layer. A refractory metal layer being formed in the contact hole, such that the natural oxide layer is changed into a conductive material by reaction with the refractory metal layer during a subsequent process step.

REFERENCES:
patent: 4866009 (1989-09-01), Matsuda
patent: 4874719 (1989-10-01), Kurosawa
patent: 4900695 (1990-02-01), Takahashi et al.
patent: 5204286 (1993-04-01), Doan
patent: 5210053 (1993-05-01), Yamagata
patent: 5304510 (1994-04-01), Suguro et al.
patent: 5422294 (1995-06-01), Noble, Jr.
patent: 5500544 (1996-03-01), Park et al.
patent: 5554565 (1996-09-01), Lian et al.
patent: 5571751 (1996-11-01), Chung
patent: 5578518 (1996-11-01), Koike et al.
patent: 5593921 (1997-01-01), Chen et al.

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