Method for forming semiconductor electrical contacts using metal

Fishing – trapping – and vermin destroying

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437190, 437192, 437194, 437197, 228254, H01L 21283, H01L 2160, H01L 21603

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active

052061868

ABSTRACT:
Annealed copper foil (12) is coated with chromium film (16), followed by coating with an appropriate thickness of gold film (14) and is thermocompression bonded to an aluminum metallized substrate (18) on a silicon chip (30) to provide solderable, high current contacts to the chip. The foil is formed into appropriate electrical network-contact patterns (40) and is bonded to the silicon chip only where aluminum metallization exists on the chip. Leaf (wing) portions (46) of the foil extend beyond the boundaries of the silicon chip for subsequent retroflexing over the foil to provide electrical contact at predesignated locations (49). External contacts to the foil are made by penetrating through a ceramic lid positioned directly above the foil area. Thus, direct thermocompression bonding of a principally copper foil to aluminum semiconductor pads can replace current gold detent/bump connections by securing a copper conductor to a silicon chip through an intermetallic AuAl.sub.2 link and an aluminum stratum.

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C. A. Neugebauer et al., "MCT Power Packaging", May 1990, Proceedings of the 40th IEEE ETCT, 2 pages.

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