Method for forming resist pattern by irradiating a resist coatin

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Forming nonplanar surface

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430311, 1566431, G03C 516, B44C 122

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active

056838573

ABSTRACT:
A method for forming a resist pattern which comprises irradiating an active light ray to a resist obtained by coating a photosensitive resin composition containing a compound capable of generating an acid due to irradiation of the active light ray and a silyloxy compound in a binder resin on a substrate through a pattern mask to decompose the silyloxy compound due to the acid generated at the irradiation region to form a silanol compound, and after removing the silanol compound, removing a film at the photosensitive region due to an oxygen plasma, a removal of said silanol compound being conducted by bringing the film after irradiation of the active light ray into contact with volatile organic solvent vapor having a boiling photosensitive composition.

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Yamaoka et al., Polymer Engineering and Science, vol. 29, No. 13, "A Novel Positive Resist for Deep UV Lithography", Mid-Jul., 1992, pp. 856-858.
Aoai et al., J. Photopolym. Sci. Technol., vol. 3, No. 3, "Application of Silylether and Silylester Polymer for Chemical Amplification System", 1990, pp. 389-400.

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