Method for forming local interconnect metal structures via the a

Semiconductor device manufacturing: process – Chemical etching – Combined with coating step

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438695, 438696, 438700, 438703, C23C 1642

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06020267&

ABSTRACT:
A method for fabricating local interconnect metal structures, overlying metal filled via hole openings, has been developed. This invention features the creation of an aluminum based interconnect structure, comprised with an underlying titanium nitride layer. The titanium nitride layer overlays a metal filled via hole, during a photolithographic exposure that is used for formation of the photoresist shapes that are needed for local interconnect metal structure patterning. The anti-reflective properties of the titanium nitride layer allow the formation of the resulting photoresist shapes to be defined without interfering reflections from the underlying metal plug.

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