Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Patent
1998-03-16
2000-02-01
Utech, Benjamin
Semiconductor device manufacturing: process
Chemical etching
Combined with coating step
438695, 438696, 438700, 438703, C23C 1642
Patent
active
06020267&
ABSTRACT:
A method for fabricating local interconnect metal structures, overlying metal filled via hole openings, has been developed. This invention features the creation of an aluminum based interconnect structure, comprised with an underlying titanium nitride layer. The titanium nitride layer overlays a metal filled via hole, during a photolithographic exposure that is used for formation of the photoresist shapes that are needed for local interconnect metal structure patterning. The anti-reflective properties of the titanium nitride layer allow the formation of the resulting photoresist shapes to be defined without interfering reflections from the underlying metal plug.
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Liaw Jhon-Jhy
Yang Ching-Yau
Ackerman Stephen B.
Perez Ramos Vanessa
Saile George O.
Taiwan Semiconductor Manufacturing Company , Ltd.
Utech Benjamin
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